MCM-11326：Active Second Source Wafer Fab Foundry Corbeil & Probing Site Corbeil [MLX81115]
Post time:2024-06-05 16:46:55
Poster:Innovo Technology
From:Network
■Type of change
●Move of all or part of electrical wafer test and/or final test to a different test site.
■Description of change
●Old Electrical wafer test location: MLX Kuching (Sarawak / Malaysia)
●New Electrical wafer test location: MLX Kuching (Sarawak / Malaysia) + Melexis Corbeil (France / Europe)
■Marking of parts / traceability of change
●Lots produced at X-fab Corbeil will have a different lot ID-number. The first letter of the lot ID will start with "F". Traceability ensured by lot number and datecode through the Melexis ERP system.
| Melexis | |
| MLX81115KLW-AAD-100-RE 、 MLX81115 More Part# | |
| Active Components 、 Integrated Circuits More | |
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More | |
| PCN/EOL More | |
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More | |
Please see the document for details | |
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More | |
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More | |
| DFN_WF12/4x4 GR | |
| English Chinese Chinese and English Japanese | |
| 08-Feb-2023 | |
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| MCM-11326 | |
| 5.2 MB | |
| April 2023 | |
| Move of all or part of electrical wafer test and/or final test to a different test site |